Microwave Electronics Measurement and Materials Characterization:Microwave Electronics: Measurement and Materials Characterization (Hardcover)by
L. F. Chen (Author),
C. K. Ong (Author),
C. P. Neo (Author),
V. V. Varadan (Author),
Vijay K. Varadan (Author)
Hardcover: 552 pages
Publisher: Wiley; 1 edition (April 30, 2004)
Language: English
ISBN-10: 0470844922
ISBN-13: 978-0470844922
Product Dimensions: 9.8 x 7.7 x 1.5 inches
Product Description
This topic is the subject of intense research and development since microwave materials form the hardware components of the present wireless telecommunications revolution. Featuring current technology developments, this book examines every aspect of microwave material properties, measurement techniques, circuit design and application.
A concise introduction to microwave theory is provided, along with an outline of the methods used to characterise microwave material properties. The authors then go on to cover both established and emerging techniques in microwave measurement in detail. Practical examples of the use of microwave materials across a range of fields, including high-speed electronics, bio-engineering, defence systems and remote sensing, are presented along with guidance on the application of microwave theory and the appropriate measurement techniques.
The final chapters look ahead to the future application requirements from microwave materials and challenges in the characterisation of materials microwave properties.
The authors are highly experienced in this field and combine many years of industrial and academic experience.
Provides a comprehensive introduction to microwave theory and microwave measurement techniques Presents materials property characterisation methods along with a discussion of the underlying theory Provides guidance on the development of suitable measurement methodologies tailored for a variety of materials and application requirements Brings together in one publication, coverage of a broad range of measurement methodologies, for the first time Covers the principles and methods for development of smart materials and smart structures Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing, bio-engineering and the physical sciences A valuable addition to the bookshelf of all practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. The authoritative approach also makes this ideal for senior students and researchers in RF and microwave engineering and microelectronics and material scientists.
From the Back Cover
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
- Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
- Examines every aspect of microwave material properties, circuit design and applications.
- Presents materials property characterisation methods along with a discussion of the underlying theory.
- Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
- Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
[
本帖最后由 drjiachen 于 2008-12-15 11:09 编辑 ]
Contents
Preface xi
1 Electromagnetic Properties of Materials 1
1.1 Materials Research and Engineering at Microwave Frequencies 1
1.2 Physics for Electromagnetic Materials 2
1.2.1 Microscopic scale 2
1.2.2 Macroscopic scale 6
1.3 General Properties of Electromagnetic Materials 11
1.3.1 Dielectric materials 11
1.3.2 Semiconductors 16
1.3.3 Conductors 17
1.3.4 Magnetic materials 19
1.3.5 Metamaterials 24
1.3.6 Other descriptions of electromagnetic materials 28
1.4 Intrinsic Properties and Extrinsic Performances of Materials 32
1.4.1 Intrinsic properties 32
1.4.2 Extrinsic performances 32
References 34
2 Microwave Theory and Techniques for Materials Characterization 37
2.1 Overview of the Microwave Methods for the Characterization of Electromagnetic Materials 37
2.1.1 Nonresonant methods 38
2.1.2 Resonant methods 40
2.2 Microwave Propagation 42
2.2.1 Transmission-line theory 42
2.2.2 Transmission Smith charts 51
2.2.3 Guided transmission lines 56
2.2.4 Surface-wave transmission lines 73
2.2.5 Free space 83
2.3 Microwave Resonance 87
2.3.1 Introduction 87
2.3.2 Coaxial resonators 93
2.3.3 Planar-circuit resonators 95
2.3.4 Waveguide resonators 97
2.3.5 Dielectric resonators 103
2.3.6 Open resonators 115
2.4 Microwave Network 119
2.4.1 Concept of microwave network 119
2.4.2 Impedance matrix and admittance matrix 119
vi Contents
2.4.3 Scattering parameters 120
2.4.4 Conversions between different network parameters 121
2.4.5 Basics of network analyzer 121
2.4.6 Measurement of reflection and transmission properties 126
2.4.7 Measurement of resonant properties 134
References 139
3 Reflection Methods 142
3.1 Introduction 142
3.1.1 Open-circuited reflection 142
3.1.2 Short-circuited reflection 143
3.2 Coaxial-line Reflection Method 144
3.2.1 Open-ended apertures 145
3.2.2 Coaxial probes terminated into layered materials 151
3.2.3 Coaxial-line-excited monopole probes 154
3.2.4 Coaxial lines open into circular waveguides 157
3.2.5 Shielded coaxial lines 158
3.2.6 Dielectric-filled cavity adapted to the end of a coaxial line 160
3.3 Free-space Reflection Method 161
3.3.1 Requirements for free-space measurements 161
3.3.2 Short-circuited reflection method 162
3.3.3 Movable metal-backing method 162
3.3.4 Bistatic reflection method 164
3.4 Measurement of Both Permittivity and Permeability Using Reflection Methods 164
3.4.1 Two-thickness method 164
3.4.2 Different-position method 165
3.4.3 Combination method 166
3.4.4 Different backing method 167
3.4.5 Frequency-variation method 167
3.4.6 Time-domain method 168
3.5 Surface Impedance Measurement 168
3.6 Near-field Scanning Probe 170
References 172
4 Transmission/Reflection Methods 175
4.1 Theory for Transmission/reflection Methods 175
4.1.1 Working principle for transmission/reflection methods 175
4.1.2 Nicolson–Ross–Weir (NRW) algorithm 177
4.1.3 Precision model for permittivity determination 178
4.1.4 Effective parameter method 179
4.1.5 Nonlinear least-squares solution 180
4.2 Coaxial Air-line Method 182
4.2.1 Coaxial air lines with different diameters 182
4.2.2 Measurement uncertainties 183
4.2.3 Enlarged coaxial line 185
4.3 Hollow Metallic Waveguide Method 187
4.3.1 Waveguides with different working bands 187
4.3.2 Uncertainty analysis 187
4.3.3 Cylindrical rod in rectangular waveguide 189
4.4 Surface Waveguide Method 190
Contents vii
4.4.1 Circular dielectric waveguide 190
4.4.2 Rectangular dielectric waveguide 192
4.5 Free-space Method 195
4.5.1 Calculation algorithm 195
4.5.2 Free-space TRL calibration 197
4.5.3 Uncertainty analysis 198
4.5.4 High-temperature measurement 199
4.6 Modifications on Transmission/reflection Methods 200
4.6.1 Coaxial discontinuity 200
4.6.2 Cylindrical cavity between transmission lines 200
4.6.3 Dual-probe method 201
4.6.4 Dual-line probe method 201
4.6.5 Antenna probe method 202
4.7 Transmission/reflection Methods for Complex Conductivity Measurement 203
References 205
5 Resonator Methods 208
5.1 Introduction 208
5.2 Dielectric Resonator Methods 208
5.2.1 Courtney resonators 209
5.2.2 Cohn resonators 214
5.2.3 Circular-radial resonators 216
5.2.4 Sheet resonators 219
5.2.5 Dielectric resonators in closed metal shields 222
5.3 Coaxial Surface-wave Resonator Methods 227
5.3.1 Coaxial surface-wave resonators 228
5.3.2 Open coaxial surface-wave resonator 228
5.3.3 Closed coaxial surface-wave resonator 229
5.4 Split-resonator Method 231
5.4.1 Split-cylinder-cavity method 231
5.4.2 Split-coaxial-resonator method 233
5.4.3 Split-dielectric-resonator method 236
5.4.4 Open resonator method 238
5.5 Dielectric Resonator Methods for Surface-impedance Measurement 242
5.5.1 Measurement of surface resistance 242
5.5.2 Measurement of surface impedance 243
References 247
6 Resonant-perturbation Methods 250
6.1 Resonant Perturbation 250
6.1.1 Basic theory 250
6.1.2 Cavity-shape perturbation 252
6.1.3 Material perturbation 253
6.1.4 Wall-impedance perturbation 255
6.2 Cavity-perturbation Method 256
6.2.1 Measurement of permittivity and permeability 256
6.2.2 Resonant properties of sample-loaded cavities 258
6.2.3 Modification of cavity-perturbation method 261
6.2.4 Extracavity-perturbation method 265
6.3 Dielectric Resonator Perturbation Method 267
6.4 Measurement of Surface Impedance 268
viii Contents
6.4.1 Surface resistance and surface reactance 268
6.4.2 Measurement of surface resistance 269
6.4.3 Measurement of surface reactance 275
6.5 Near-field Microwave Microscope 278
6.5.1 Basic working principle 278
6.5.2 Tip-coaxial resonator 279
6.5.3 Open-ended coaxial resonator 280
6.5.4 Metallic waveguide cavity 284
6.5.5 Dielectric resonator 284
References 286
7 Planar-circuit Methods 288
7.1 Introduction 288
7.1.1 Nonresonant methods 288
7.1.2 Resonant methods 290
7.2 Stripline Methods 291
7.2.1 Nonresonant methods 291
7.2.2 Resonant methods 292
7.3 Microstrip Methods 297
7.3.1 Nonresonant methods 298
7.3.2 Resonant methods 300
7.4 Coplanar-line Methods 309
7.4.1 Nonresonant methods 309
7.4.2 Resonant methods 311
7.5 Permeance Meters for Magnetic Thin Films 311
7.5.1 Working principle 312
7.5.2 Two-coil method 312
7.5.3 Single-coil method 314
7.5.4 Electrical impedance method 315
7.6 Planar Near-field Microwave Microscopes 317
7.6.1 Working principle 317
7.6.2 Electric and magnetic dipole probes 318
7.6.3 Probes made from different types of planar transmission lines 319
References 320
8 Measurement of Permittivity and Permeability Tensors 323
8.1 Introduction 323
8.1.1 Anisotropic dielectric materials 323
8.1.2 Anisotropic magnetic materials 325
8.2 Measurement of Permittivity Tensors 326
8.2.1 Nonresonant methods 327
8.2.2 Resonator methods 333
8.2.3 Resonant-perturbation method 336
8.3 Measurement of Permeability Tensors 340
8.3.1 Nonresonant methods 340
8.3.2 Faraday rotation methods 345
8.3.3 Resonator methods 351
8.3.4 Resonant-perturbation methods 355
8.4 Measurement of Ferromagnetic Resonance 370
8.4.1 Origin of ferromagnetic resonance 370
8.4.2 Measurement principle 371
Contents ix
8.4.3 Cavity methods 373
8.4.4 Waveguide methods 374
8.4.5 Planar-circuit methods 376
References 379
9 Measurement of Ferroelectric Materials 382
9.1 Introduction 382
9.1.1 Perovskite structure 383
9.1.2 Hysteresis curve 383
9.1.3 Temperature dependence 383
9.1.4 Electric field dependence 385
9.2 Nonresonant Methods 385
9.2.1 Reflection methods 385
9.2.2 Transmission/reflection method 386
9.3 Resonant Methods 386
9.3.1 Dielectric resonator method 386
9.3.2 Cavity-perturbation method 389
9.3.3 Near-field microwave microscope method 390
9.4 Planar-circuit Methods 390
9.4.1 Coplanar waveguide method 390
9.4.2 Coplanar resonator method 394
9.4.3 Capacitor method 394
9.4.4 Influence of biasing schemes 404
9.5 Responding Time of Ferroelectric Thin Films 405
9.6 Nonlinear Behavior and Power-Handling Capability of Ferroelectric Films 407
9.6.1 Pulsed signal method 407
9.6.2 Intermodulation method 409
References 412
10 Microwave Measurement of Chiral Materials 414
10.1 Introduction 414
10.2 Free-space Method 415
10.2.1 Sample preparation 416
10.2.2 Experimental procedure 416
10.2.3 Calibration 417
10.2.4 Time-domain measurement 430
10.2.5 Computation of ε, μ, and β of the chiral composite samples 434
10.2.6 Experimental results for chiral composites 440
10.3 Waveguide Method 452
10.3.1 Sample preparation 452
10.3.2 Experimental procedure 452
10.3.3 Computation of ε,μ, and ξ of the chiral composite samples 453
10.3.4 Experimental results for chiral composites 454
10.4 Concluding Remarks 458
References 458
11 Measurement of Microwave Electrical Transport Properties 460
11.1 Hall Effect and Electrical Transport Properties of Materials 460
11.1.1 Direct current Hall effect 461
11.1.2 Alternate current Hall effect 461
11.1.3 Microwave Hall effect 461
x Contents
11.2 Nonresonant Methods for the Measurement of Microwave Hall Effect 464
11.2.1 Faraday rotation 464
11.2.2 Transmission method 465
11.2.3 Reflection method 469
11.2.4 Turnstile-junction method 473
11.3 Resonant Methods for the Measurement of the Microwave Hall Effect 475
11.3.1 Coupling between two orthogonal resonant modes 475
11.3.2 Hall effect of materials in MHE cavity 476
11.3.3 Hall effect of endplate of MHE cavity 482
11.3.4 Dielectric MHE resonator 484
11.3.5 Planar MHE resonator 486
11.4 Microwave Electrical Transport Properties of Magnetic Materials 486
11.4.1 Ordinary and extraordinary Hall effect 486
11.4.2 Bimodal cavity method 487
11.4.3 Bimodal dielectric probe method 489
References 489
12 Measurement of Dielectric Properties of Materials at High Temperatures 492
12.1 Introduction 492
12.1.1 Dielectric properties of materials at high temperatures 492
12.1.2 Problems in measurements at high temperatures 494
12.1.3 Overviews of the methods for measurements at high temperatures 496
12.2 Coaxial-line Methods 497
12.2.1 Measurement of permittivity using open-ended coaxial probe 498
12.2.2 Problems related to high-temperature measurements 498
12.2.3 Correction of phase shift 500
12.2.4 Spring-loaded coaxial probe 502
12.2.5 Metallized ceramic coaxial probe 502
12.3 Waveguide Methods 503
12.3.1 Open-ended waveguide method 503
12.3.2 Dual-waveguide method 504
12.4 Free-space Methods 506
12.4.1 Computation of ε∗r 507
12.5 Cavity-Perturbation Methods 510
12.5.1 Cavity-perturbation methods for high-temperature measurements 510
12.5.2 TE10n mode rectangular cavity 512
12.5.3 TM mode cylindrical cavity 514
12.6 Dielectric-loaded Cavity Method 520
12.6.1 Coaxial reentrant cavity 520
12.6.2 Open-resonator method 523
12.6.3 Oscillation method 524
References 528
Index 531
Microwave Electronics Measurement and Materials Characterization.part1
ص
[ 本帖最后由 drjiachen 于 2008-12-15 15:51 编辑 ]
Microwave Electronics Measurement and Materials Characterization.part2
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Measurement and Materials Characterization
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Microwave Electronics Measurement and Materials Characterization: mm.jpg
